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厂商 包装系列逻辑类型电源电压位数工作温度安装类型封装/外壳供应商器件封装
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PDF 缩略图 器件名称 制造商 描述
SN74SSTU32864GKER SN74SSTU32864GKER Texas Instruments IC 25BIT CONFIG REG BUFF 96LFBGA
SN74SSTU32864GKER SN74SSTU32864GKER Texas Instruments IC 25BIT CONFIG REG BUFF 96LFBGA
74SSTUB32868AZRHR 74SSTUB32868AZRHR Texas Instruments IC REGSTR BUFFER 28-56BIT 176BGA
74SSTUB32868AZRHR 74SSTUB32868AZRHR Texas Instruments IC REGSTR BUFFER 28-56BIT 176BGA
74SSTUB32868AZRHR 74SSTUB32868AZRHR Texas Instruments IC REGSTR BUFFER 28-56BIT 176BGA
74SSTVF32852ZKFR 74SSTVF32852ZKFR Texas Instruments IC RGSTRD BUFF 24-48BIT 114BGA
74SSTVF32852ZKFR 74SSTVF32852ZKFR Texas Instruments IC RGSTRD BUFF 24-48BIT 114BGA
CSSTV32867SGKEREP CSSTV32867SGKEREP Texas Instruments IC REGISTERED BUFF 26BIT 96LFBGA
CSSTV32867SGKEREP CSSTV32867SGKEREP Texas Instruments IC REGISTERED BUFF 26BIT 96LFBGA
8V182512IDGGREP 8V182512IDGGREP Texas Instruments IC ABT SCAN TEST DEV3.3V 64TSSOP
8V182512IDGGREP 8V182512IDGGREP Texas Instruments IC ABT SCAN TEST DEV3.3V 64TSSOP
8V182512IDGGREP 8V182512IDGGREP Texas Instruments IC ABT SCAN TEST DEV3.3V 64TSSOP
SN74SSTU32866ZKER SN74SSTU32866ZKER Texas Instruments IC 25BIT CONFIG REG BUFF 96-BGA
SN74SSTU32866ZKER SN74SSTU32866ZKER Texas Instruments IC 25BIT CONFIG REG BUFF 96-BGA
SN74ABT18504PM SN74ABT18504PM Texas Instruments IC SCAN-TEST-DEV/TXRX 64-LQFP
SN74LVTH18646APM SN74LVTH18646APM Texas Instruments IC SCAN-TEST-DEV/XCVR 64-LQFP
SN74LVTH182652APM SN74LVTH182652APM Texas Instruments IC SCAN TEST DEVICE ABT 64-LQFP
SN74LVTH18652APM SN74LVTH18652APM Texas Instruments IC TXRX/REG 18BIT 3.3V 64-LQFP
SN74ABTH18646APM SN74ABTH18646APM Texas Instruments IC SCAN-TEST-DEV/TXRX 64-LQFP
SN74ABTH18652APM SN74ABTH18652APM Texas Instruments IC SCAN-TEST-DEV/TXRX 64-LQFP
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