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厂商 包装系列逻辑类型电源电压位数工作温度安装类型封装/外壳供应商器件封装
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PDF 缩略图 器件名称 制造商 描述
SN74ABTE16245DLR SN74ABTE16245DLR Texas Instruments IC 16BIT I-WS BUS TXRX 48-SSOP
SN74ABT8996PWR SN74ABT8996PWR Texas Instruments IC ADDRESSABLE SCAN PORT 24TSSOP
SN74ABT8996PWR SN74ABT8996PWR Texas Instruments IC ADDRESSABLE SCAN PORT 24TSSOP
SN74ABT8996PWR SN74ABT8996PWR Texas Instruments IC ADDRESSABLE SCAN PORT 24TSSOP
SN74ABT8996DWR SN74ABT8996DWR Texas Instruments IC ADDRESSABLE SCAN PORT 24-SOIC
SN74ABT8996DWR SN74ABT8996DWR Texas Instruments IC ADDRESSABLE SCAN PORT 24-SOIC
SN74ABT8996DWR SN74ABT8996DWR Texas Instruments IC ADDRESSABLE SCAN PORT 24-SOIC
SN74LVT8980ADWR SN74LVT8980ADWR Texas Instruments IC TEST-BUS CONTROLLER 24-SOIC
SN74LVT8980ADWR SN74LVT8980ADWR Texas Instruments IC TEST-BUS CONTROLLER 24-SOIC
SN74LVT8980ADWR SN74LVT8980ADWR Texas Instruments IC TEST-BUS CONTROLLER 24-SOIC
SN74LVT8980ADWRG4 SN74LVT8980ADWRG4 Texas Instruments IC TEST-BUS CONTROLLER 24-SOIC
SN74ABT8543DLR SN74ABT8543DLR Texas Instruments IC SCAN TEST DEVICE 28-SSOP
SN74LVT8986ZGV SN74LVT8986ZGV Texas Instruments IC LINK ADDRSS SCAN-PORT 64-BGA
SN74LVTH18502APM SN74LVTH18502APM Texas Instruments IC SCAN-TEST-DEV/XCVR 64-LQFP
SN74LVTH18502APMG4 SN74LVTH18502APMG4 Texas Instruments IC SCAN-TEST-DEV/XCVR 64-LQFP
SN74LVTH18504APMG4 SN74LVTH18504APMG4 Texas Instruments IC SCAN-TEST-DEV/XCVR 64-LQFP
SN74BCT8373ADW SN74BCT8373ADW Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC
SN74SSTVF32852KR SN74SSTVF32852KR Texas Instruments IC BUFFER 24BIT-48BIT 114LFBGA
SN74SSTVF32852KR SN74SSTVF32852KR Texas Instruments IC BUFFER 24BIT-48BIT 114LFBGA
SN74BCT8244ADW SN74BCT8244ADW Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC
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