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厂商 包装系列逻辑类型电源电压位数工作温度安装类型封装/外壳供应商器件封装
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PDF 缩略图 器件名称 制造商 描述
SN74BCT8244ADWE4 SN74BCT8244ADWE4 Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8245ADW SN74BCT8245ADW Texas Instruments IC SCAN TEST DEVICE TXRX 24-SOIC
SN74LVT8986GGV SN74LVT8986GGV Texas Instruments IC LINK ADDRSS SCAN-PORT 64-BGA
SN74LVT8996DW SN74LVT8996DW Texas Instruments IC 10-BIT SCAN PORT XCVR 24-SOIC
SN74ACT8997DW SN74ACT8997DW Texas Instruments IC SCAN-PATH LINKER 28-SOIC
SN74ABT8996PW SN74ABT8996PW Texas Instruments IC ADDRESSABLE SCAN PORT 24TSSOP
SN74ABT8996DW SN74ABT8996DW Texas Instruments IC ADDRESSABLE SCAN PORT 24-SOIC
SN74LVT8980ADW SN74LVT8980ADW Texas Instruments IC TEST-BUS CONTROLLER 24-SOIC
SN74ABT8646DLG4 SN74ABT8646DLG4 Texas Instruments IC SCAN TEST DEVICE 28-SSOP
SN74FB2033ARCRG3 SN74FB2033ARCRG3 Texas Instruments IC REGISTERED TXRX 8BIT 52QFP
SN74BCT8244ANT SN74BCT8244ANT Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8244ANTE4 SN74BCT8244ANTE4 Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8373ANT SN74BCT8373ANT Texas Instruments IC SCAN TEST DEVICE LATCH 24-DIP
SN74ABT18245ADL SN74ABT18245ADL Texas Instruments IC SCAN-TEST-DEV/TXRX 56-SSOP
SN74ABTE16245DLG4 SN74ABTE16245DLG4 Texas Instruments IC 16BIT I-WS BUS TXRX 48-SSOP
SN74ABT8652DLG4 SN74ABT8652DLG4 Texas Instruments IC SCAN TEST DEVICE 28-SSOP
SN74ABTE16246DLG4 SN74ABTE16246DLG4 Texas Instruments IC 11BIT I-WS BUS TXRX 48-SSOP
LM9780CCVS/NOPB LM9780CCVS/NOPB Texas Instruments NON-STANDARD PART CALL FIRST
SN74ABT18502PMR SN74ABT18502PMR Texas Instruments IC SCAN TEST DEVICE 18BIT 64LQFP
SN74SSQE32882ZCJR SN74SSQE32882ZCJR Texas Instruments IC REG BUFF 28-56BIT 176BGA
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