| 缩略图 | 器件名称 | 制造商 | 描述 | |
|---|---|---|---|---|
|
|
SN74AS181ADWE4 | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC |
|
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|
SN74AS181ADWR | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC |
|
|
|
SN74AS181ADWRE4 | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC |
|
|
|
SN74AS181ANT | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24DIP |
|
|
|
SN74AS181ANTE4 | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24DIP |
|
|
|
SN74BCT29854DWR | Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC |
|
|
|
SN74BCT29854DWRE4 | Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC |
|
|
|
SN74BCT8240ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC |
|
|
|
SN74BCT8240ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC |
|
|
|
SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP |
|
|
|
SN74BCT8240ANTE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP |
|
|
|
SN74BCT8244ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC |
|
|
|
SN74BCT8245ANT | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP |
|
|
|
SN74BCT8245ANTE4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP |
|
|
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC |
|
|
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC |
|
|
|
SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC |
|
|
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC |
|
|
|
SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP |
|
|
|
SN74BCT8374ANTE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP |
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