| 缩略图 | 器件名称 | 制造商 | 描述 | |
|---|---|---|---|---|
|
|
SN74F283DR | Texas Instruments | IC FULL ADDER 4BIT BIN 16-SOIC |
|
|
|
SN74F283NSR | Texas Instruments | IC FULL ADDER 4BIT BIN 16SO |
|
|
|
SN74F283NSRE4 | Texas Instruments | IC FULL ADDER 4BIT BIN 16SO |
|
|
|
SN74FB2033ARCR | Texas Instruments | IC REGISTERED TXRX 8BIT 52-QFP |
|
|
|
SN74FB2033KRCR | Texas Instruments | IC REGISTERED TXRX 8BIT 52-QFP |
|
|
|
SN74GTLP2033ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56BGA |
|
|
|
SN74GTLP2034ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56BGA |
|
|
|
SN74GTLP22033ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56BGA |
|
|
|
SN74GTLP22034ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56BGA |
|
|
|
SN74ABT18504PMR | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP |
|
|
|
SN74ABT18504PMRG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP |
|
|
|
SN74ABT18640DLR | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP |
|
|
|
SN74ABT18640DLRG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP |
|
|
|
SN74ABT8543DWR | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC |
|
|
|
SN74ABT8543DWRE4 | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC |
|
|
|
SN74ABT8646DWR | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC |
|
|
|
SN74ABT8646DWRE4 | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC |
|
|
|
SN74ABT8652DLR | Texas Instruments | IC SCAN TEST DEVICE 28-SSOP |
|
|
|
SN74ABT8652DLRG4 | Texas Instruments | IC SCAN TEST DEVICE 28-SSOP |
|
|
|
SN74ABT8652DWR | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC |
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