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厂商 包装系列逻辑类型电源电压位数工作温度安装类型封装/外壳供应商器件封装
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PDF 缩略图 器件名称 制造商 描述
SN74F283DR SN74F283DR Texas Instruments IC FULL ADDER 4BIT BIN 16-SOIC
SN74F283NSR SN74F283NSR Texas Instruments IC FULL ADDER 4BIT BIN 16SO
SN74F283NSRE4 SN74F283NSRE4 Texas Instruments IC FULL ADDER 4BIT BIN 16SO
SN74FB2033ARCR SN74FB2033ARCR Texas Instruments IC REGISTERED TXRX 8BIT 52-QFP
SN74FB2033KRCR SN74FB2033KRCR Texas Instruments IC REGISTERED TXRX 8BIT 52-QFP
SN74GTLP2033ZQLR SN74GTLP2033ZQLR Texas Instruments IC TXRX ADJ EDGE 8BIT 56BGA
SN74GTLP2034ZQLR SN74GTLP2034ZQLR Texas Instruments IC TXRX ADJ EDGE 8BIT 56BGA
SN74GTLP22033ZQLR SN74GTLP22033ZQLR Texas Instruments IC TXRX ADJ EDGE 8BIT 56BGA
SN74GTLP22034ZQLR SN74GTLP22034ZQLR Texas Instruments IC TXRX ADJ EDGE 8BIT 56BGA
SN74ABT18504PMR SN74ABT18504PMR Texas Instruments IC SCAN TEST DEVICE 20BIT 64LQFP
SN74ABT18504PMRG4 SN74ABT18504PMRG4 Texas Instruments IC SCAN TEST DEVICE 20BIT 64LQFP
SN74ABT18640DLR SN74ABT18640DLR Texas Instruments IC SCAN TEST DEVICE 18BIT 56SSOP
SN74ABT18640DLRG4 SN74ABT18640DLRG4 Texas Instruments IC SCAN TEST DEVICE 18BIT 56SSOP
SN74ABT8543DWR SN74ABT8543DWR Texas Instruments IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWRE4 SN74ABT8543DWRE4 Texas Instruments IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWR SN74ABT8646DWR Texas Instruments IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWRE4 SN74ABT8646DWRE4 Texas Instruments IC SCAN TEST DEVICE 28-SOIC
SN74ABT8652DLR SN74ABT8652DLR Texas Instruments IC SCAN TEST DEVICE 28-SSOP
SN74ABT8652DLRG4 SN74ABT8652DLRG4 Texas Instruments IC SCAN TEST DEVICE 28-SSOP
SN74ABT8652DWR SN74ABT8652DWR Texas Instruments IC SCAN TEST DEVICE 28-SOIC
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